The Contour GT-X by Bruker has a self-calibrating, metrology optimising laser reference, automated measurement capabilities (focus, intensity, tip/tilt head, staging, FOV) and nanometer-scale resolution on high-contour surfaces.

A non-contact, high-resolution and fast measurement technique known as optical interference technology can be used as a measure for development and quality control. By Dr Sun Wanxin, senior applications manager, nano surfaces division, Bruker

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